MEASUREMENT DEVICE
关于老挝专利「MEASUREMENT DEVICE」，老商通整理了如下公开信息，由 TOYO KOHAN CO., LTD 于 2022-02-16 提交申请，当前状态为已注册。标识字段包括：申请号 P/920；DIP 编号 LAP920；主管局代码 LA；保护类型 Patent - PCT National Phase。时间线要点：公开/公告日 2026-01-23；授权日 2026-01-08；届满/失效参考日 2042-02-16。国际分类 / IPC 标注为 G01B 21/00、G01B 21/30。发明人 / 设计人包括 KIMURA Kazunori、NAKAZAWA Nobuo。代理机构 / 代理人记载为 Tilleke & Gibbins Lao Co., Ltd。公开摘要提示：The present invention provides a measurement device capable of more precisely measuring the flatness of an object of measurement even if th…。
P/920
图样
基础信息
- 类型
- 专利
- 申请号
P/920- 状态
- 已注册
- 申请人
- TOYO KOHAN CO., LTD
- 代理机构
- Tilleke & Gibbins Lao Co., Ltd
- 申请日期
- 2022-02-16
- 注册号
P/920- 公开 / 公告日
- 2026-01-23
- 注册 / 授权日
- 2026-01-08
- 到期日
- 2042-02-16
- 保护类型
- Patent - PCT National Phase
- 公报号
- 338 · 2026-01-09
- 优先权
- JP · 2021-024594 · 2021-02-18
- 申请人地址
- TOYO KOHAN CO., LTD · 18-1, Higashi-Gotanda 2- Chome, Shinagawa-ku, Tokyo 1418260, JAPAN · JP
- 代理地址
- Tilleke & Gibbins Lao Co., Ltd · No. 302/1B, 3rd Floor, Vieng Vang Tower, Unit 15, Boulichan Road, Dongpalan Thong Village, Sisattanak District, Vientiane Capital, Lao PDR · LA
- 国际分类
- G01B 21/00 · G01B 21/30
- 商品 / 服务
- —
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摘要
The present invention provides a measurement device capable of more precisely measuring the flatness of an object of measurement even if the object of measurement is relatively thin in shape. The present invention is a measurement device 20 that measures a disk 10, including an A-surface measuring portion that measures a surface of the disk l0 and a first transfer portion 24 that transfers the disk 10. The A-surface measuring portion includes a measurement reference surface 6l a that is inclined at an inclination angle 0 with respect to a vertical direction. The first transfer portion 24 includes a holding portion 81 that holds the disk l0 such that the disk l0 is in parallel with the measurement reference surface 6la. The holding portion 81 holds the disk l0 and moves in the vertical direction while maintaining a posture in which the disk l0 is inclined at an inclination angle 0, and performs the attachment and detachment of the disk l0 to and from the A-surface measuring portion 23.
The present invention provides a measurement device capable of more precisely measuring the flatness of an object of measurement even if the object of measurement is relatively thin in shape. The present invention is a measurement device 20 that measures a disk 10, including an A-surface measuring portion that measures a surface of the disk l0 and a first transfer portion 24 that transfers the disk 10. The A-surface measuring portion includes a measurement reference surface 6l a that is inclined at an inclination angle 0 with respect to a vertical direction. The first transfer portion 24 includes a holding portion 81 that holds the disk l0 such that the disk l0 is in parallel with the measurement reference surface 6la. The holding portion 81 holds the disk l0 and moves in the vertical direction while maintaining a posture in which the disk l0 is inclined at an inclination angle 0, and performs the attachment and detachment of the disk l0 to and from the A-surface measuring portion 23.
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