Patent Registered

MEASUREMENT DEVICE

LaoBiz.com profiles the Laos Patent “MEASUREMENT DEVICE” from open registry fields, filed by TOYO KOHAN CO., LTD on 2022-02-16; current status: Registered. Identifiers include application No. P/920; DIP id LAP920; protection kind Patent - PCT National Phase. Key dates: publication 2026-01-23; grant 2026-01-08; expiry reference 2042-02-16. Classification: G01B 21/00、G01B 21/30. Inventor(s)/designer(s): KIMURA Kazunori, NAKAZAWA Nobuo. Abstract hint: The present invention provides a measurement device capable of more precisely measuring the flatness of an object of measurement even if th…. Unique application identifiers, holders and classification text are surfaced here to reduce near-duplicate IP landing pages; always verify against the competent office.

Patent Laos DIP

App. no. P/920
Filing date 2022-02-16
Registration / grant 2026-01-08
Expiry 2042-02-16
Applicant TOYO KOHAN CO., LTD
Agent Tilleke & Gibbins Lao Co., Ltd
Classes G01B 21/00 · G01B 21/30

Mark

Key facts

Type
Patent
App. no.
P/920
Status
Registered
Applicant
TOYO KOHAN CO., LTD
Agent
Tilleke & Gibbins Lao Co., Ltd
Filing date
2022-02-16
Reg. no.
P/920
Publication
2026-01-23
Registration / grant
2026-01-08
Expiry
2042-02-16
Protection kind
Patent - PCT National Phase
Gazette
338 · 2026-01-09
Priority
JP · 2021-024594 · 2021-02-18
Applicant address
TOYO KOHAN CO., LTD · 18-1, Higashi-Gotanda 2- Chome, Shinagawa-ku, Tokyo 1418260, JAPAN · JP
Agent address
Tilleke & Gibbins Lao Co., Ltd · No. 302/1B, 3rd Floor, Vieng Vang Tower, Unit 15, Boulichan Road, Dongpalan Thong Village, Sisattanak District, Vientiane Capital, Lao PDR · LA
Nice / IPC classes
G01B 21/00 · G01B 21/30
Goods / services
—

Process

Steps follow the current public status
  1. Filed
  2. Formal examination
  3. Substantive examination
  4. Published
  5. Granted

Related records

Linked from the LaoBiz.com company database

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Abstract

The present invention provides a measurement device capable of more precisely measuring the flatness of an object of measurement even if the object of measurement is relatively thin in shape. The present invention is a measurement device 20 that measures a disk 10, including an A-surface measuring portion that measures a surface of the disk l0 and a first transfer portion 24 that transfers the disk 10. The A-surface measuring portion includes a measurement reference surface 6l a that is inclined at an inclination angle 0 with respect to a vertical direction. The first transfer portion 24 includes a holding portion 81 that holds the disk l0 such that the disk l0 is in parallel with the measurement reference surface 6la. The holding portion 81 holds the disk l0 and moves in the vertical direction while maintaining a posture in which the disk l0 is inclined at an inclination angle 0, and performs the attachment and detachment of the disk l0 to and from the A-surface measuring portion 23.

The present invention provides a measurement device capable of more precisely measuring the flatness of an object of measurement even if the object of measurement is relatively thin in shape. The present invention is a measurement device 20 that measures a disk 10, including an A-surface measuring portion that measures a surface of the disk l0 and a first transfer portion 24 that transfers the disk 10. The A-surface measuring portion includes a measurement reference surface 6l a that is inclined at an inclination angle 0 with respect to a vertical direction. The first transfer portion 24 includes a holding portion 81 that holds the disk l0 such that the disk l0 is in parallel with the measurement reference surface 6la. The holding portion 81 holds the disk l0 and moves in the vertical direction while maintaining a posture in which the disk l0 is inclined at an inclination angle 0, and performs the attachment and detachment of the disk l0 to and from the A-surface measuring portion 23.

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